Matyushonok, O. A., Гомельський державний університет ім. Франциска Скоріни, Belarus
-
Vol 5, No 1 (2014): Chemistry, Physics and Technology of Surface / Himia, Fizika ta Tehnologia Poverhni - Articles
AFM and SEM study on the morphology of SiO2 nanoparticles in polishing slurries
Abstract PDF (Українська)
Copyright © 2010-2024 Chemistry, Physics and Technology of Surface / Himia, Fizika ta Tehnologia Poverhni
This work is licensed under a Creative Commons Attribution 4.0 International License.